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Criteria Towards Metrics for Benchmarking Template Protection Algorithms

Published

Author(s)

Eddy Simoens, Bian Yang, Xuebing Zhou, Filipe Beato, Christoph Busch, Elaine M. Newton, Bart Preneel

Abstract

Traditional criteria used in biometric performance evaluation do not cover all the performance aspects of biometric template protection (BTP) and the lack of well-defined metrics inhibits the proper evaluation of such methods. Previous work in the literature focuses, in general, on a limited set of criteria and methods. This paper provides the first holistic approach to the evaluation of biometric template protection that is able to cover a whole range of methods. We present a selection of well-defined criteria and metrics that are compliant with the reference architecture for template protection as defined in the recently adopted standard ISO/IEC 24745 (2011), which is applicable to nearly all known BTP methods. The metrics have been grouped in three categories of performance: technical, security and privacy, and operational. In addition, the visualization and representation of scores is discussed and a method for the unification of scores is proposed.
Proceedings Title
Proceedings of the 5th IEEE/IAPR International Conference on Biometrics (ICB 2012)
Conference Dates
March 30-April 1, 2012
Conference Location
New Delhi, IN
Conference Title
5th IEEE/IAPR International Conference on Biometrics (ICB 2012)

Keywords

biometrics, template protection, BTP, renewable biometrics, revocable biometrics, cancellable biometrics, benchmark testing

Citation

Simoens, E. , Yang, B. , Zhou, X. , Beato, F. , Busch, C. , Newton, E. and Preneel, B. (2012), Criteria Towards Metrics for Benchmarking Template Protection Algorithms, Proceedings of the 5th IEEE/IAPR International Conference on Biometrics (ICB 2012) , New Delhi, IN, [online], https://doi.org/10.1109/ICB.2012.6199799, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=910305 (Accessed October 10, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 29, 2012, Updated October 12, 2021