Wiederhorn, S.
, Krause, R.
, Lofaj, F.
and Taffner, U.
(2005),
Creep Behavior of Improved High Temperature Silicon Nitride, Key Engineering Materials
(Accessed May 11, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Creep Behavior of Improved High Temperature Silicon Nitride
Published
Author(s)
, , F Lofaj, U Taffner
Citation
Key Engineering Materials
Volume
287
Pub Type
Journals
Keywords
creep, high temperature, lutetium oxide, rare-earth oxide, siliconnitride, ytterbium oxide, yttrium oxide
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 1, 2005, Updated February 17, 2017