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Continuous Highly-Charged Ion Beams from the NIST EBIT

Published

Author(s)

L P. Ratliff, E W. Bell, D C. Parks, A I. Pikin, John D. Gillaspy
Citation
Review of Scientific Instruments
Volume
68

Citation

Ratliff, L. , Bell, E. , Parks, D. , Pikin, A. and Gillaspy, J. (1997), Continuous Highly-Charged Ion Beams from the NIST EBIT, Review of Scientific Instruments (Accessed July 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1997, Updated February 17, 2017