Greenfeld, S.
and Weeks, J.
(1963),
A comparison of thin-film oxidation with conventional weatherometer exposures:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.RPT.8110
(Accessed December 12, 2024)
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A comparison of thin-film oxidation with conventional weatherometer exposures:
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- NBS report ; 8110
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NBS report ; 8110
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NIST Pubs
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Created January 1, 1963, Updated May 19, 2023