Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Comparison of Mechanically Milled and Sputter Deposited Tin-Cobalt-Carbon Alloys using Small Angle Neutron Scattering

Published

Author(s)

A.D.W. Todd, P.P. Ferguson, John Barker, M.D. Fleischauer, J.R. Dahn

Abstract

Small Angle Neutron Scattering (SANS) has been used to compare nanostructured Sn-Co-C alloys produced by vertical axis mechanical attriting to those produced by magnetron sputter deposition. It was found that the attrited materials had grain sizes that vary with composition and are on the order of 60 Å in size. The sputter deposited materials were either amorphous or had a grain size of approximately 10 Å, depending on the composition. The SANS results were used to further understand the electrochemistry of these materials when used as negative electrodes for lithium ion batteries and to understand why mechanically alloyed Sn-Co-C alloys are far from reaching their expected theoretical specific capacity while sputtered alloys achieve capacities much closer to the expected value.
Citation
Chemistry of Materials
Volume
156
Issue
12

Keywords

Lithium Ion battery, negative electrode, tin-cobalt-carbon, small angle neutron scattering, mechanical milling, magnetron sputtering

Citation

Todd, A. , Ferguson, P. , Barker, J. , Fleischauer, M. and Dahn, J. (2009), Comparison of Mechanically Milled and Sputter Deposited Tin-Cobalt-Carbon Alloys using Small Angle Neutron Scattering, Chemistry of Materials, [online], https://doi.org/10.1149/1.3239988, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902906 (Accessed October 8, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 22, 2009, Updated March 15, 2024