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Combinatorial Approach to the Edge Delamination Test for Thin Film Reliability --- Concept, Results and Variability

Published

Author(s)

Martin Chiang, R Song, A J. Crosby, W L. KarimA:Wu, Eric J. Amis
Conference Location
Wilmington, NC
Conference Title
Adhesion Society Extended Abstracts

Keywords

Combinatorial and THE Methods, Combinatorial method, Mechanical Properties, Thin Films, adhesion reliability, edge delamination, thin film

Citation

Chiang, M. , Song, R. , Crosby, A. , KarimA:Wu, W. and Amis, E. (2004), Combinatorial Approach to the Edge Delamination Test for Thin Film Reliability --- Concept, Results and Variability, Adhesion Society Extended Abstracts, Wilmington, NC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853933 (Accessed June 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2003, Updated October 12, 2021