Vilkomir, S.
, Alluri, A.
, Kuhn, D.
and Kacker, R.
(2017),
Combinatorial and MC/DC Coverage Levels of Random Testing, IEEE International Conference on Software Quality Reliability and Security, Prague, CZ, [online], https://doi.org/10.1109/QRS-C.2017.19, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921959
(Accessed April 19, 2024)
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Combinatorial and MC/DC Coverage Levels of Random Testing
Published
Author(s)
Sergiy Vilkomir, Aparna Alluri, ,
Abstract
Software testing criteria differ in effectiveness, numbers of required test cases, and processes of test generation. Specific criteria are often compared with random testing as the simplest basic approach and, in some cases, random testing shows a surprisingly high level of effectiveness. One of the reasons is that any random test set has a specific level of coverage according to any coverage criterion. Numerical evaluation of coverage levels of random testing according to various coverage criteria is an interesting research task and important for understanding the relationship between different testing approaches. In this paper, we experimentally evaluate the coverage levels of random testing for two criteria: MC/DC and combinatorial t-way testing. The results could be used for selecting optimal methods for practical testing and for developing new testing methods based on integrating existing approaches.Conference Dates
July 25-29, 2017
Conference Location
Prague, CZ
Conference Title
IEEE International Conference on Software Quality Reliability and Security
Pub Type
Conferences
Download Paper
Keywords
random testing, combinatorial testing, MC/DC, pairwise, coverage
Citation
Created August 17, 2017, Updated October 12, 2021