@conference{820261,
  author = {Sergiy Vilkomir and Aparna Alluri and D. Kuhn and Raghu Kacker},
  title = {Combinatorial and MC/DC Coverage Levels of Random Testing},
  year = {2017},
  month = {2017-08-18 00:08:00},
  publisher = {IEEE International Conference on Software Quality Reliability and Security, Prague, CZ},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921959},
  doi = {https://doi.org/10.1109/QRS-C.2017.19},
  language = {en},
}