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Chiral Modulations and Reorientation Effects in MnSi Thin Films

Published

Author(s)

E. A. Karhu, U.K. Robler, A.N. Bogdanov, S. Kahwaji, Brian Kirby, H. Fritzsche, M. D. Robertson, Charles Majkrzak, T. L. Monchesky
Citation
Physical Review B
Volume
85
Issue
9

Keywords

polarized neutron reflectometry, magnetism

Citation

Karhu, E. , Robler, U. , Bogdanov, A. , Kahwaji, S. , Kirby, B. , Fritzsche, H. , Robertson, M. , Majkrzak, C. and Monchesky, T. (2012), Chiral Modulations and Reorientation Effects in MnSi Thin Films, Physical Review B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=910206 (Accessed April 18, 2024)
Created March 26, 2012, Updated October 12, 2021