Zimmerman, N.
, Yang, H.
, , N.
, , W.
and Dzurak, A.
(2014),
Charge Offset Stability in Si Single Electron Devices with Al Gates, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=913831
(Accessed November 2, 2024)