McKnight, R.
, Lagnese, J.
and Zhang, Y.
(1990),
Characterizing Transient Measurements by Use of the Step Response and the Convolution Integral, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=27889
(Accessed April 19, 2024)
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Characterizing Transient Measurements by Use of the Step Response and the Convolution Integral
Published
Author(s)
R. H. McKnight, J. Lagnese, Y. Zhang
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
39
Issue
2
Pub Type
Journals
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Citation
Created March 31, 1990, Updated October 12, 2021