Sunday, D.
, Ren, J.
, Liman, C.
, Williamson, L.
, Gronheid, R.
, Nealey, P.
and Kline, R.
(2017),
Characterizing Pattered Block Copolymer Thin Films with Soft X-rays, ACS Applied Materials and Interfaces, [online], https://doi.org/10.1021/acsami.7b02791
(Accessed December 3, 2024)
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Characterizing Pattered Block Copolymer Thin Films with Soft X-rays
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, Jiaxing Ren, , Lance Williamson, Roel Gronheid, Paul Nealey,
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ACS Applied Materials and Interfaces
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Created September 20, 2017, Updated January 27, 2020