Characterizing LTE User Equipment Emissions: Factor Screening

Published

September 30, 2019

Author(s)

Jason Coder, Adam Wunderlich, Michael R. Frey, Paul T. Blanchard, Dan Kuester, Azizollah Kord, Max Lees, Aric Sanders, Jolene Splett, Lucas N. Koepke, Rob Horansky, Duncan McGillivray, John M. Ladbury, Jeffrey T. Correia, Venkatesh Ramaswamy, Jerediah Fevold, Shawn Lefebre, Jacob K. Johnson, John Carpenter, Mark Lofquist, Keith Hartley, Melissa Midzor

Abstract

Characterizations of long-term evolution (LTE) user equipment (UE) emissions are a key ingredient in models of interference between wireless cellular networks and other systems that must use the same radio frequency spectrum. This report presents (i) a laboratory test methodology for measuring LTE UE emissions under a wide range of conditions, and (ii) the results of a factor screening experiment involving 28 factors (e.g., evolved node B (eNB) power control variables, eNB scheduling algorithms, network loading, traffic type) that aimed to determine which factors have a significant impact on physical uplink shared channel (PUSCH) power per physical resource block (PRB). The results given here demonstrate the validity of the proposed test methodology and illustrate how factor screening experiments can be used to better understand the emissions of typical commercial off-the-shelf LTE UEs.

Citation

Technical Note (NIST TN) - 2069

Report Number

2069

NIST Pub Series

Technical Note (NIST TN)

Pub Type

NIST Pubs

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DOI Link

Keywords

wireless communications, factor screening

Citation

Coder, J. , Wunderlich, A. , Frey, M. , Blanchard, P. , Kuester, D. , Kord, A. , Lees, M. , Sanders, A. , Splett, J. , Koepke, L. , Horansky, R. , McGillivray, D. , Ladbury, J. , Correia, J. , Ramaswamy, V. , Fevold, J. , Lefebre, S. , Johnson, J. , Carpenter, J. , Lofquist, M. , Hartley, K. and Midzor, M. (2019), Characterizing LTE User Equipment Emissions: Factor Screening, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.2069 (Accessed October 8, 2025)