Kim, D.
, Okamoto, K.
, Goldner, L.
and Hwang, J.
(2006),
Characterization of single functionalized quantum dots using combined atomic force and confocal fluorescence microscopy, SPIE (Accessed May 17, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Characterization of single functionalized quantum dots using combined atomic force and confocal fluorescence microscopy
Published
Author(s)
D S. Kim, K Okamoto, ,
Citation
SPIE
Volume
6096
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 2005, Updated October 12, 2021