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PUBLICATIONS

Characterization of a SI-Traceable Vacuum-Compatible Precision Nanoindentation Platform

Published

Author(s)

Bartosz K. Nowakowski, Douglas T. Smith, Stuart Smith

Abstract

This paper discusses the ongoing development of a vacuum-compatible, precision nano-indentation platform (PNP) that is directly traceable to Système International d'Unités (SI). In particular, results from recent initiatives to address environmental control, vibration (acoustic and mechanical) and electronic and mechanical stability are presented. Preliminary force-displacement data for Berkovich indentation of silica are also reported.
Citation
Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology
Pub Type
Journals

Keywords

nanoindentation, Berkovich indentation
Nanometrology and Ceramics

Citation

Nowakowski, B. , Smith, D. and Smith, S. (2012), Characterization of a SI-Traceable Vacuum-Compatible Precision Nanoindentation Platform, Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology (Accessed October 14, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created October 21, 2012, Updated October 12, 2021
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