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Characterization of a SI-Traceable Vacuum-Compatible Precision Nanoindentation Platform

Published

Author(s)

Bartosz K. Nowakowski, Douglas T. Smith, Stuart Smith

Abstract

This paper discusses the ongoing development of a vacuum-compatible, precision nano-indentation platform (PNP) that is directly traceable to Système International d'Unités (SI). In particular, results from recent initiatives to address environmental control, vibration (acoustic and mechanical) and electronic and mechanical stability are presented. Preliminary force-displacement data for Berkovich indentation of silica are also reported.
Citation
Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology

Keywords

nanoindentation, Berkovich indentation

Citation

Nowakowski, B. , Smith, D. and Smith, S. (2012), Characterization of a SI-Traceable Vacuum-Compatible Precision Nanoindentation Platform, Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology (Accessed February 21, 2024)
Created October 21, 2012, Updated October 12, 2021