Gu, X.
, Raghavan, D.
, Nguyen, T.
and VanLandingham, M.
(2000),
Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy, 220 American Chemical Society National Meeting, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=860277
(Accessed October 7, 2024)
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Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy
Published
Author(s)
, D T. Raghavan, , Mark R. VanLandingham
Abstract
Tapping mode AFM was used to examine the microstructure of polyester films before and after exposure to an alkaline solution. Bright-colored microgel domains and dark-colored interstitial regions were observed in phase images of the unexposed samples. The microstructure of polyester film was substantially changed after exposure. More and deeper pits were observed on the sample surfaces with increasing exposure time. Phase imaging and force curves indicated that the properties of the regions in the degradation pits are significantly different from those of undegraded regions. The localized nature of pit initiation and propagation is believed to result from the heterogeneity of the polyester film.Proceedings Title
220 American Chemical Society National Meeting
Volume
83
Conference Dates
August 20-24, 2000
Conference Title
American Chemical Society
Pub Type
Conferences
Download Paper
Keywords
AFM, building technology, coating, degradation, heterogeneity, nanoindentation, phase imaging, polymer
Citation
Issues
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Created August 1, 2000, Updated February 19, 2017