Tsai, B.
, Meyer, C.
and Lovas, F.
(2000),
Characterization of Lightpipe Radiation Thermometers for the NIST Test Bed, Proceedings of the 8th International Conference on Advanced Thermal Processing of Semiconductors
RTP 2000, Gaithersburg, MD
(Accessed September 17, 2024)
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Characterization of Lightpipe Radiation Thermometers for the NIST Test Bed
Published
Author(s)
, ,
Proceedings Title
Proceedings of the 8th International Conference on Advanced Thermal Processing of Semiconductors
RTP 2000
RTP 2000
Conference Dates
September 18-21, 2000
Conference Location
Gaithersburg, MD
Conference Title
8th International Conference on Advanced Thermal Processing of Semiconductors
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 1, 2000, Updated February 19, 2017