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Characterization of Lightpipe Radiation Thermometers for the NIST Test Bed

Published

Author(s)

Benjamin K. Tsai, Christopher W. Meyer, Francis J. Lovas
Proceedings Title
Proceedings of the 8th International Conference on Advanced Thermal Processing of Semiconductors
RTP 2000
Conference Dates
September 18-21, 2000
Conference Location
Gaithersburg, MD
Conference Title
8th International Conference on Advanced Thermal Processing of Semiconductors

Citation

Tsai, B. , Meyer, C. and Lovas, F. (2000), Characterization of Lightpipe Radiation Thermometers for the NIST Test Bed, Proceedings of the 8th International Conference on Advanced Thermal Processing of Semiconductors RTP 2000, Gaithersburg, MD (Accessed February 21, 2024)
Created September 1, 2000, Updated February 19, 2017