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Chapter 4: Oxidatively induced DNA damage: Mechanisms and measurement

Published

Author(s)

Miral M. Dizdar, Erdem Coskun, Gamze Tuna, Melis Kant, Pawel Jaruga

Abstract

Oxidatively induced damage to DNA occurs in living organisms by endogenously or exogenously generated reactive species including free radicals. Mounting evidence suggests that this type of DNA damage plays an important role in the etiology of numerous disease processes including carcinogenesis. Free radicals react with DNA bases and 2′-deoxyribose by a variety of mechanisms to generate a plethora of mutagenic and/or cytotoxic products. DNA repair pathways exist in living cells to restore DNA structure. Accurate measurement of DNA products is essential for understanding of mechanisms, cellular repair and biological onsequences of oxidatively induced DNA damage. Various analytical techniques with their own advantages and drawbacks are used for this purpose. Mass spectrometric techniques with isotope-dilution provide structural elucidation and accurate quantification of DNA products in vitro and in vivo such as DNA base and 2′-deoxyribose products, 8,5'-cyclopurine-2'-deoxynucleosides, base-base tandem lesions and DNA- protein cross-links. This chapter reviews the mechanisms of product formation and the measurement of DNA products by mass spectrometric techniques. Repair and biological consequences of oxidatively induced DNA damage are also briefly discussed.
Citation
DNA Damage, DNA Repair and Disease
Volume
1
Publisher Info
Royal Society of Chemistry, Cambridge,

Keywords

DNA damage, DNA repair, oxidatively induced DNA damage, GC-MS/MS, LC-MS/MS, measurement of DNA damage

Citation

Dizdar, M. , Coskun, E. , Tuna, G. , Kant, M. and Jaruga, P. (2020), Chapter 4: Oxidatively induced DNA damage: Mechanisms and measurement, Royal Society of Chemistry, Cambridge, , [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929577 (Accessed October 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 20, 2020, Updated October 14, 2021