Mattis, R.
(1972),
Carrier lifetime measurement by the photoconductive decay method:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.736
(Accessed September 15, 2024)
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Carrier lifetime measurement by the photoconductive decay method:
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- NBS TN 736
Report Number
NBS TN 736
Pub Type
NIST Pubs
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Created January 1, 1972, Updated May 19, 2023