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PUBLICATIONS

Boron Analysis in Synthetic Diamond Films Using Cold Neutron Depth Profiling

Published

Author(s)

George P. Lamaze, Robert G. Downing
Proceedings Title
International Workshop on Semiconductor Characterization: Present and Future Needs
Conference Location
PA
Conference Title
Proceedings of the International Workshop on Semiconductor Characterization: Present and Future Needs
Pub Type
Conferences

Citation

Lamaze, G. and Downing, R. (1996), Boron Analysis in Synthetic Diamond Films Using Cold Neutron Depth Profiling, International Workshop on Semiconductor Characterization: Present and Future Needs, PA (Accessed October 22, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 1, 1996, Updated February 17, 2017
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