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Boron Analysis in Synthetic Diamond Films Using Cold Neutron Depth Profiling

Published

Author(s)

George P. Lamaze, Robert G. Downing
Proceedings Title
International Workshop on Semiconductor Characterization: Present and Future Needs
Conference Location
PA
Conference Title
Proceedings of the International Workshop on Semiconductor Characterization: Present and Future Needs

Citation

Lamaze, G. and Downing, R. (1996), Boron Analysis in Synthetic Diamond Films Using Cold Neutron Depth Profiling, International Workshop on Semiconductor Characterization: Present and Future Needs, PA (Accessed February 28, 2024)
Created December 1, 1996, Updated February 17, 2017