Rachakonda, P.
, Iyer, H.
, Franaszek, M.
and Saidi, K.
(2026),
Bootstrap Metric for Quantifying the Depth Resolution of 3D Sensors, Proceedings of the 2026 SPIE Defense + Security Conference, National Harbor, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961663 (Accessed April 30, 2026)
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Bootstrap Metric for Quantifying the Depth Resolution of 3D Sensors
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Abstract
Depth resolution of a 3D imaging system or 3D sensor is defined as the smallest change in physical depth that causes a detectable change in the corresponding measured or derived depth. The ability of a sensor to resolve depth on a particular target is correlated with the sensor noise on that target. This work presents a novel metric for calculating the depth resolution of a 3D sensor.Proceedings Title
Proceedings of the 2026 SPIE Defense + Security Conference
Conference Dates
April 26-30, 2026
Conference Location
National Harbor, MD, US
Conference Title
2026 SPIE Defense + Security Conference
Pub Type
Conferences
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Keywords
3D imaging systems, sensor parameters, depth resolution, Bootstrapping, standards, ASTM E57
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Created April 27, 2026, Updated April 29, 2026