Villarrubia, J.
(1997),
Blind Estimation of Tip Geometry in Scanned Probe Microscopy, Proceedings of Microscopy and Microanalysis, Unknown, USA
(Accessed April 19, 2024)
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Blind Estimation of Tip Geometry in Scanned Probe Microscopy
Published
Author(s)
Abstract
Broadening of surface protrusions is a well-known imaging artifact in scanned probe microscope topographs. Blind reconstruction is a method for estimating the tip shape from the image of a tip characterizer, without independent knowledge of the characterizer geometry. A description of and a plausibility argument for blind reconstruction are given. A recent development for discriminating against other (non-tip-induced) image artifacts is summarized.Proceedings Title
Proceedings of Microscopy and Microanalysis
Volume
3
Issue
Supplement 2
Conference Dates
August 1, 1997
Conference Location
Unknown, USA
Pub Type
Conferences
Keywords
atomic force microscopy, blind reconstruction, scanned probe microscopy, scanning tunneling microscopy, tip artifacts, tip estimation
Citation
Created August 1, 1997, Updated February 19, 2017