Germer, T.
and Asmail, C.
(1997),
Bidirectional Ellipsometry and its Application to the Characterization of Surfaces, ed. by D.H. Goldstein and R.A. Chipman, Polarization Measurement Analysis and Remote Sensing SPIE
(Accessed May 15, 2024)
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Bidirectional Ellipsometry and its Application to the Characterization of Surfaces, ed. by D.H. Goldstein and R.A. Chipman
Published
Author(s)
,
Citation
Polarization Measurement Analysis and Remote Sensing SPIE
Volume
3121
Pub Type
Journals
Citation
Issues
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Created January 1, 1997, Updated February 17, 2017