French, J.
(1964),
Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.232
(Accessed December 5, 2024)
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Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices:
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- NBS TN 232
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NBS TN 232
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NIST Pubs
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Created January 1, 1964, Updated May 19, 2023