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Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices:

Published

Author(s)

Judson C French
Citation
- NBS TN 232
Report Number
NBS TN 232

Citation

French, J. (1964), Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.232 (Accessed April 12, 2024)
Created January 1, 1964, Updated May 19, 2023