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Basis for the Bauschinger Effect in Copper Single Crystals: Changes in the Long-Range Internal Stress with Reverse Deformation

Published

Author(s)

Lyle E. Levine, Mark R. Stoudt, Adam A. Creuziger, Thien Q. Phan, Xu Ruqing, Kassner Mike

Abstract

To investigate the long range internal stresses (LRIS) associated with the Bauschinger effect using synchrotron x-ray microbeam diffraction, two [100] oriented Cu single crystals were deformed in compression to approximately -0.3 true strain. Tensile deformation was then applied to one of these samples, resulting in an additional tensile strain of approximately +0.02. The results indicate that long range internal stresses (LRIS) developed by the compressive deformation persist after a plastic tensile strain of +0.02 despite a significant reduction of the overall dislocation density. The overall LRIS in the deformed Cu, however, are relatively small and the pronounced Bauschinger effect in Cu is probably best rationalized by the Orowan- Sleeswyk model that relies on a non-uniform distribution of dislocation obstacles rather than the LRIS.
Citation
Journal of Materials Science
Issue
54

Keywords

Bauschinger effect, work hardening, fatigue, internal stress

Citation

Levine, L. , Stoudt, M. , Creuziger, A. , Phan, T. , Ruqing, X. and Mike, K. (2019), Basis for the Bauschinger Effect in Copper Single Crystals: Changes in the Long-Range Internal Stress with Reverse Deformation, Journal of Materials Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926258 (Accessed December 5, 2021)
Created January 7, 2019, Updated April 15, 2020