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Backreflection X-Ray Standing Waves and Crystal Truncation Rods as Structure Probe for Epilayer-Substrate Systems

Published

Author(s)

H Hashizume, M Sugiyama, T Niwa, O Sakata, P L. Cowan
Citation
Review of Scientific Instruments
Volume
63

Citation

Hashizume, H. , Sugiyama, M. , Niwa, T. , Sakata, O. and Cowan, P. (1992), Backreflection X-Ray Standing Waves and Crystal Truncation Rods as Structure Probe for Epilayer-Substrate Systems, Review of Scientific Instruments (Accessed May 24, 2024)

Issues

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Created January 1, 1992, Updated February 17, 2017