Hashizume, H.
, Sugiyama, M.
, Niwa, T.
, Sakata, O.
and Cowan, P.
(1992),
Backreflection X-Ray Standing Waves and Crystal Truncation Rods as Structure Probe for Epilayer-Substrate Systems, Review of Scientific Instruments
(Accessed September 17, 2024)
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Backreflection X-Ray Standing Waves and Crystal Truncation Rods as Structure Probe for Epilayer-Substrate Systems
Published
Author(s)
H Hashizume, M Sugiyama, T Niwa, O Sakata, P L. Cowan
Citation
Review of Scientific Instruments
Volume
63
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1992, Updated February 17, 2017