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An Approximate Approach to Determining the Permittivity and Permeability near Lambda/2 Resonances in Transmission/Reflection Measurements
Published
Author(s)
Sung Kim, Michael D. Janezic, James R. Baker-Jarvis
Abstract
We present a simple and straightforward approximate approach to removing resonant artifacts that arise in the material parameters extracted near half-wavelength resonances that arise from transmission/reflection (T/R) measurements on low-loss materials. In order to determine material parameters near one such ¿/2 resonance, by means of the 1st-order regressions for the input impedance of the sample-loaded transmission line, we approximate the characteristic impedance of the sample-loaded transmission line, we approximate the characteristic impedance of the sample-filled section that is, in turn, dependent either on the relative wave impedance in a coaxial transmission line or on the relative permeability in a rectangular waveguide case. The other material parameters are then found, supplemented with the refractive index obtained from the conventional T/R method. This method applies to both coaxial transmission line and rectangular waveguide measurements. Our approach is validated by use of S-parameters simulated for a low-loss magnetic material, and is also applied to determine the relative permittivity and permeability from S-parameters measured for nylon and lithium-ferrite samples. The results are discussed as compared to those from the well-known Nicolson-Ross-Weir (NRW) method and are experimentally compared to those from the Baker-Jarvis (BJ) method as well.
Kim, S.
, Janezic, M.
and Baker-Jarvis, J.
(2014),
An Approximate Approach to Determining the Permittivity and Permeability near Lambda/2 Resonances in Transmission/Reflection Measurements, Measurement Science & Technology, [online], https://doi.org/10.2528/PIERB13121308
(Accessed October 14, 2025)