Tang, Y.
(2005),
Applications of Programmable Josephson Voltage Standard in Voltage Metrology, Proc. VI Semetro, Rio de Janeiro, BR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31992
(Accessed December 3, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Applications of Programmable Josephson Voltage Standard in Voltage Metrology
Published
Author(s)
Abstract
A new type of Josephson junction array using current biased voltage steps can provide highly stable and accurate voltages. The superior voltage stability of such a Josephson voltage standard has many applications in dc voltage metrology. This paper describes the working principle of the programmable Josephson voltage standard (PJVS) using this new array technology and few examples of its applications.Proceedings Title
Proc. VI Semetro
Conference Dates
September 21-23, 2005
Conference Location
Rio de Janeiro, BR
Conference Title
VI Semetro International Seminar on Electrical Metrology
Pub Type
Conferences
Download Paper
Keywords
Josephson voltage standard comparison, programmable Josephson voltage standard (PJVS), uncertainty, voltage dissemination
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 1, 2005, Updated January 27, 2020