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Application of Conformal Mapping Approximation Techniques: Parallel Conductors of Finite Dimensions

Published

Author(s)

Nadine Guillaume, Walter K. Kahn, Richard A. Allen, Michael W. Cresswell, Mona E. Zaghloul

Abstract

This paper describes a novel approach to the application of conformal mapping to capacitance evaluation. A particular structure composed of an array of identical lines and located below a conductive plate is studied. Results show that the application of conformal mapping can reduce computing-time when using three-dimensional electrostatic modeling and be the basis of algorithms of practical applications, especially in the semiconductor industry.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
53
Issue
3

Keywords

capacitance evaluation, conformal mapping

Citation

Guillaume, N. , Kahn, W. , Allen, R. , Cresswell, M. and Zaghloul, M. (2004), Application of Conformal Mapping Approximation Techniques: Parallel Conductors of Finite Dimensions, IEEE Transactions on Microwave Theory and Techniques (Accessed June 18, 2024)

Issues

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Created May 31, 2004, Updated October 12, 2021