Application of Conformal Mapping Approximation Techniques: Parallel Conductors of Finite Dimensions

Published

June 1, 2004

Author(s)

Nadine Guillaume, Walter K. Kahn, Richard A. Allen, Michael W. Cresswell, Mona E. Zaghloul

Abstract

This paper describes a novel approach to the application of conformal mapping to capacitance evaluation. A particular structure composed of an array of identical lines and located below a conductive plate is studied. Results show that the application of conformal mapping can reduce computing-time when using three-dimensional electrostatic modeling and be the basis of algorithms of practical applications, especially in the semiconductor industry.

Citation

IEEE Transactions on Microwave Theory and Techniques

Volume

53

Issue

3

Pub Type

Journals

Keywords

capacitance evaluation, conformal mapping

Citation

Guillaume, N. , Kahn, W. , Allen, R. , Cresswell, M. and Zaghloul, M. (2004), Application of Conformal Mapping Approximation Techniques: Parallel Conductors of Finite Dimensions, IEEE Transactions on Microwave Theory and Techniques (Accessed November 28, 2023)