Park, B.
, Choi, J.
, Ahn, S.
, Kim, D.
, Joon, L.
, Dixson, R.
, Orji, N.
, Fu, J.
and Vorburger, T.
(2007),
Application of Carbon Nanotube Probes in a Critical Dimension Atomic Force Microscope, Proceedings of SPIE, San Jose, CA, US
(Accessed December 9, 2024)