Andrle, A.
, H?nicke, P.
, Vinson, J.
, Quintanilha, R.
, Saadeh, Q.
, Heidenreich, S.
, Scholze, F.
and Soltwisch, V.
(2021),
The anisotropy in the optical constants of quartz crystals for soft X-rays, Journal of Applied Crystallography, [online], https://doi.org/10.1107/S1600576720016325, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929887
(Accessed April 26, 2024)
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The anisotropy in the optical constants of quartz crystals for soft X-rays
Published
Author(s)
Anna Andrle, Phillipp H?nicke, , Richard Quintanilha, Qais Saadeh, Sebastian Heidenreich, Frank Scholze, Victor Soltwisch
Abstract
The refractive index of a y-cut SiO2 crystal surface is reconstructed from orientation-dependent soft X-ray reflectometry measurements in the energy range from 45 to 620 eV. Owing to the anisotropy of the crystal structure in the (100) and (001) directions, a significant deviation of the measured reflectance at the Si L2,3 and O K absorption edges is observed. The anisotropy in the optical constants reconstructed from these data is also confirmed by ab initio Bethe–Salpeter equation calculations for the O K edge. This new experimental data set expands the existing literature data for quartz crystal optical constants significantly, particularly in the near-edge regions.Citation
Journal of Applied Crystallography
Volume
54
Pub Type
Journals
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Citation
Created February 19, 2021, Updated October 12, 2021