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The anisotropy in the optical constants of quartz crystals for soft X-rays



Anna Andrle, Phillipp H?nicke, John Vinson, Richard Quintanilha, Qais Saadeh, Sebastian Heidenreich, Frank Scholze, Victor Soltwisch


The refractive index of a y-cut SiO2 crystal surface is reconstructed from orientation-dependent soft X-ray reflectometry measurements in the energy range from 45 to 620 eV. Owing to the anisotropy of the crystal structure in the (100) and (001) directions, a significant deviation of the measured reflectance at the Si L2,3 and O K absorption edges is observed. The anisotropy in the optical constants reconstructed from these data is also confirmed by ab initio Bethe–Salpeter equation calculations for the O K edge. This new experimental data set expands the existing literature data for quartz crystal optical constants significantly, particularly in the near-edge regions.
Journal of Applied Crystallography


Andrle, A. , H?nicke, P. , Vinson, J. , Quintanilha, R. , Saadeh, Q. , Heidenreich, S. , Scholze, F. and Soltwisch, V. (2021), The anisotropy in the optical constants of quartz crystals for soft X-rays, Journal of Applied Crystallography, [online],, (Accessed April 23, 2024)
Created February 19, 2021, Updated October 12, 2021