Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

The anisotropy in the optical constants of quartz crystals for soft X-rays

Published

Author(s)

Anna Andrle, Phillipp H?nicke, John Vinson, Richard Quintanilha, Qais Saadeh, Sebastian Heidenreich, Frank Scholze, Victor Soltwisch

Abstract

The refractive index of a y-cut SiO2 crystal surface is reconstructed from orientation-dependent soft X-ray reflectometry measurements in the energy range from 45 to 620 eV. Owing to the anisotropy of the crystal structure in the (100) and (001) directions, a significant deviation of the measured reflectance at the Si L2,3 and O K absorption edges is observed. The anisotropy in the optical constants reconstructed from these data is also confirmed by ab initio Bethe–Salpeter equation calculations for the O K edge. This new experimental data set expands the existing literature data for quartz crystal optical constants significantly, particularly in the near-edge regions.
Citation
Journal of Applied Crystallography
Volume
54

Citation

Andrle, A. , H?nicke, P. , Vinson, J. , Quintanilha, R. , Saadeh, Q. , Heidenreich, S. , Scholze, F. and Soltwisch, V. (2021), The anisotropy in the optical constants of quartz crystals for soft X-rays, Journal of Applied Crystallography, [online], https://doi.org/10.1107/S1600576720016325, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929887 (Accessed April 23, 2024)
Created February 19, 2021, Updated October 12, 2021