Gaury, B.
and Haney, P.
(2017),
Analytical description of charged grain boundary recombination in polycrystalline thin film solar cells, 44th IEEE Photovoltaic specialist conference, Washington, d.c., DC, [online], https://doi.org/10.1109/PVSC.2017.8366730
(Accessed May 21, 2024)
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Analytical description of charged grain boundary recombination in polycrystalline thin film solar cells
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Abstract
We present analytic expressions for the dark current-voltage relation of a pn+ junction with a positively charged columnar grain boundary, containing a distribution of defect states in the band gap. A closed form relation for the open-circuit voltage Voc is provided for an illuminated junction. These findings are verified by direct comparison with numerical simulations, and provide a quantitative understanding of the reduction of Voc by grain boundaries in thin film photovoltaic materials.Proceedings Title
44th IEEE Photovoltaic specialist conference
Conference Dates
June 25-30, 2017
Conference Location
Washington, d.c., DC
Conference Title
IEEE Photovoltaic specialist conference
Pub Type
Conferences
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Created June 26, 2017, Updated February 5, 2019