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Accurate spectral characterization of polarization dependent loss

Published

Author(s)

Rex M. Craig

Abstract

Building on previous work, a rapid, automated, non-mechanical measurement system for spectral characterization of polarization dependent loss is presented. A deterministic fixed-states method in conjunction with real-time calibrated spectral information is used to infer wavelength-dependent Mueller matrix elements from power ratios at specific polarization states. Voltage-modulated liquid-crystal variable retarders set the input polarization states. A narrow, voltage-tuned filter generates a wavelength sweep from a broadband source. The sweep is calibrated in real-time by hydrogen cyanide reference lines. Actively balanced photodetection is employed to achieve low noise signals. I present polarization-dependent loss measurements from 0.0003 to 0.30 dB at 1550 nm to verify performance and also present results from artifact calibration standards of an all-fiber design.
Proceedings Title
Tech. Dig., Symp. on Optical Fiber Meas.
Issue
5
Conference Dates
September 26-28, 2000
Conference Location
Boulder, CO

Citation

Craig, R. (2000), Accurate spectral characterization of polarization dependent loss, Tech. Dig., Symp. on Optical Fiber Meas., Boulder, CO, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=4220 (Accessed June 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 1, 2000, Updated February 17, 2017