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Accurate, precise pressure sensing with tethered optomechanics

Published

Author(s)

Olivia Green, Yiliang Bao, John R. Lawall, Jason Gorman, Daniel Barker

Abstract

We show that optomechanical pressure sensors with characterized density and thickness can achieve uncertainty as low as 1.1 % via comparison with a secondary pressure standard. The agreement between the secondary standard and our optomechanical sensors is a necessary step toward using optomechanical devices as primary pressure sensors. Our silicon nitride and silicon carbide sensors are short-term and long-term stable, displaying Allan deviations compatible with better than 1 % precision and baseline drift significantly lower than the secondary standard. Our measurements also yield the in situ thin-film density of our sensors with 1 % total uncertainty or lower, aiding development of other optomechanical sensors. Our results demonstrate that optomechanical pressure sensors can achieve accuracy, precision, and drift sufficient to replace high-performance legacy pressure gauges.
Citation
Physical Review Applied
Volume
24

Keywords

optomechanics, vacuum metrology, pressure metrology

Citation

Green, O. , Bao, Y. , Lawall, J. , Gorman, J. and Barker, D. (2025), Accurate, precise pressure sensing with tethered optomechanics, Physical Review Applied, [online], https://doi.org/10.1103/9dtb-sk2j, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958374 (Accessed September 14, 2025)

Issues

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Created August 28, 2025, Updated September 9, 2025
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