Cunningham, C.
, Park, G.
, Cabrera, B.
and Huber, M.
(1993),
Absolute Magnetic Penetration Depth of Thin-film Niobium Measured by Fluxoid Quantization, Applied Physics Letters
(Accessed May 1, 2025)
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Absolute Magnetic Penetration Depth of Thin-film Niobium Measured by Fluxoid Quantization
Published
Author(s)
C. E. Cunningham, G. S. Park, B. Cabrera,
Citation
Applied Physics Letters
Volume
62
Issue
17
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 1993, Updated October 12, 2021