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NIST Pubs

Basic Mass Metrology

Author(s)
Georgia L. Harris
Basic Mass Metrology CD-ROM training course. Course is designed to run after the CD is inserted in a Windows-based computer.

Review of Instrumented Indentation

Author(s)
Mark R. VanLandingham
Instrumented indentation, also known as depth-sensing indentation or nanoindentation, is increasingly being used to probe the mechanical response of materials...

On the Stability of Exponential Backoff

Author(s)
N-O Song, B-J Kwak, Leonard E. Miller
New analytical results are given for the stability and performance of the exponential backoff (EB) algorithm. Previous studies on the stability of the (binary)...

A Link-Level Simulator of the CDMA2000 Reverse-Link Layer

Author(s)
Hamid Gharavi, R Wyatt-Millington, F Chin, K Ban
This paper presents the design and implementation of a simulation model for the cdma2000 reverse link. The model includes all the radio configurations and their...

Viewing Technologies for CAD Models

Author(s)
Michelle P. Steves, Simon P. Frechette
This report describes Computer-Aided Design (CAD) model-viewing technologies1 used to support CAD-model review and analysis. CAD model viewers are tools that...

Government Smart Card Interoperability Specification, Version 2.1

Author(s)
Teresa T. Schwarzhoff, James F. Dray Jr., John P. Wack, Eric Dalci, Alan H. Goldfine, Michaela Iorga
This Government Smart Card Interoperability Specification (GSC-IS) provides solutions to a number of the interoperability challenges associated with smart card...

Missing Data Methods and Toolbox Users Guide

Author(s)
Curtis H. Parks, Gerard N. Stenbakken, Alexei Nikolaev
Measurement data are collected to characterize a production run of devices that can then be analyzed to identify a reduced set of measurement points. Such...
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