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Journals

Measuring Out-of-Plane Permittivity of Thin Films to Millimeter Wave Frequencies

Author(s)
Florian Bergmann, Meagan Papac, Benjamin Jamroz, Nicholas Jungwirth, Bryan Bosworth, Anna Osella, Tomasz Karpisz, Lucas Enright, Eric Marksz, Angela Stelson, Christian Long, Nathan Orloff, Robert Jones
Modern microchips utilize multilayer stack-ups with many interstitial layers of dielectrics. Optimizing device performance and maximizing yield requires precise...

Interlaboratory Assessment of Candidate Reference Materials for Lentiviral Vector Copy Number and Integration Site Measurements

Author(s)
Hua-Jun He, Zhiyong He, Steven Lund, Barbara Paugh, Jennifer McDaniel, Justin Zook, Sierra Miller, Samantha Maragh, Simona Patange, Mahir Mohiuddin, Alessandro Tona, John Elliott, Kenneth Cole, Sheng Lin-Gibson
Reference materials are essential for accurately measuring integrated lentiviral vector (LV) copy number (VCN) and integration sites for the safety and efficacy...

Charge-exchange processes in EBIT: implications for spectral analysis of few-electron Fe ions

Author(s)
Yang Yang, FNU Dipti, Amy Gall, Nancy Brickhouse, Hunter Staiger, Galen O'Neil, Paul Szypryt, Adam Foster, David Schultz, Aung Naing, Joseph Tan, Daniel Swetz, Michael Fogle, Randall Smith, Yuri Ralchenko, Endre Takacs
Charge-exchange recombination with neutral atoms significantly influences the ionization balance in electron beam ion traps (EBIT) because its cross section is...

XTDB, an XML based format for Calphad databases

Author(s)
Bo Sundman, Fabio Miani, Axel van de Walle, Bengt Hallstedt, Ursula Kattner, Florian Tang, Taichi Abe, Reza Naraghi, Erwin Povoden-Karadeniz, Aurelie Jacob, Shuanglin Chen, Richard Otis, Kazuhisa Shobu, Malin Selleby, Alexander Pisch
The Calphad method uses models which depend on assessed parameters to describe the thermodynamic properties of materials. These model parameters are assessed by...
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