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Conferences

IP Security in Structured ASIC: Challenges and Prospects

Author(s)
Rasheed Almawzan, Sudipta Paria, Aritra Dasgupta, Kostas Amberiadis, Swarup Bhunia
With the globalization of hardware manufacturing and the growing demand for electronics, companies now heavily rely on offshore facilities for most of the

Manufacturing Digital Twin Standards

Author(s)
Guodong Shao
As a foundation of digital transformation, digital twins are critical for achieving smart manufacturing. Recent technology advancements, such as smart sensors

On Combinatorial Security Testing for the Tor Anonymity Network Client

Author(s)
Dimitris Simos, Bernhard Garn, Dominik-Philip Schreiber, Manuel Leithner, David Kuhn, Raghu Kacker
In this paper, we present an application of combinatorial security testing to the well-known anonymity network Tor. Rigorous testing of the Tor network is

CHARACTERIZATION OF MICROWAVE BLACKBODY WITH MONOSTATIC MEASUREMENT

Author(s)
Dazhen Gu, Jonah Smith, Adam Whitney, Omar Khatib, Natalie Rozman, Amanda Gregg, Willie Padilla, William Deal, Steven Reising
This paper describes a characterization method for measuring the reflectivity of blackbodies used as calibration devices in spaceborne instruments. The

Traceable RF Power Metering Procedures With Thermoelectric Sensors

Author(s)
Zenn Roberts, Aaron Hagerstrom, Cole Gray, Angela Stelson, Vincent Neylon, Christian Long
The National Institute of Standards and Technology (NIST) maintains the United State's primary standards for traceable RF and mm-wave power measurements. These

Optimization of Wye-Δ-Type Quantum Hall Resistance Standard

Author(s)
Yanfei Yang, Dean G. Jarrett, Alireza Panna, Albert Rigosi, David B. Newell, Randolph Elmquist, Cheng Hsueh Yang, Ngoc Thanh Mai Tran
Theoretically wye-delta transformation can be used to realize ultra-high resistances up to PΩ. For graphene-based quantum Hall array resistance standards
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