We focus primarily on arrays of magnetic nanostructures in order to reveal how defects alter the fundamental physics of magnetization reversal processes in the nanometer regime. We have an integrated approach that consists of four inter-related elements. The first element, film edge metrology, addresses the role of the edge on magnetic behavior uniformity in magnetic nanostructures. The second element, magneto-optical nanostructure spectroscopy, is meant to provide fast and precise individual nanostructure "fingerprints". Another element, microscopy, provides quantitative microstructure and defect information that can be correlated with magnetic behavior. Finally, nanomagnetic modeling element offers an efficient and accurate theoretical predictive tool.
Magnetization reversal in nanodots