The MAGIK reflectometer complements thePolarized Beam Reflectometer and theHorizontal-Geometry Reflectometer in providing specialized capabilities for measurements of in-plane scattering in addition to world-class depth-profiling (with specular reflectivity) of biological,battery/electrochemical, polymer, and magnetic thin films.
Additional Technical Details
Refrigerators, furnaces, magnets, liquid cells, and lasers are available for control of sample environment. On-site x-ray reflectometry is available for additional sample characterization. If you're interested in performing an experiment, apply for beamtime, or contact one of the instrument scientists directly. Monetary assistance may be available for new facility users.
Related NIST Projects
- Description and characteristics of AND/R
- Beamwidth calculator for MAGIK, including distances between slits on the instrument
- Scattering and Reflectivity Formalism
- Instrument Schedule
- Obtaining Beamtime