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Summary
The MAGIK reflectometer complements thePolarized Beam Reflectometer and theHorizontal-Geometry Reflectometer in providing specialized capabilities for measurements of in-plane scattering in addition to world-class depth-profiling (with specular reflectivity) of biological,battery/electrochemical, polymer, and magnetic thin films.
Description
Off-specular scattering Ewald construction
Polarized-beam measurements are possible with the use of a 3He analyzer.
This instrument is an evolution of the AND/R reflectometer, which was located on the NG-1 guide. MAGIK is located along the NG-D guide in the expanded guide hall (part of the NCNR's Expansion Initiative).
Major Accomplishments
Interactive online scattering demos
(requires Chrome, Firefox, Safari or IE9+)
 Reflectometry calculator |
 Alignment simulator |
 Offspecular scattering planner |
Support
Refrigerators, furnaces, magnets, liquid cells, and lasers are available for control of sample environment. On-site x-ray reflectometry is available for additional sample characterization. If you're interested in performing an experiment, apply for beamtime, or contact one of the instrument scientists directly. Monetary assistance may be available for new facility users.