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Yu Xin Wen ()

Publications

On the response time constant of interface defects

Author(s)
Kin Cheung, Yu Xin Wen, Bing-Yue Tsui
Interface defect response time is a key parameter in some common electrical measurements of MOS devices, most notably the hi-lo CV measurement as well as the
Created February 2, 2024, Updated June 27, 2025
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