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Yicheng Wang


Alignment and testing of the NIST Calculable Capacitor

Yicheng Wang, Felipe Guzman, Corey A. Stambaugh, Radek Smid, Hugo Zuniga Calvo, Andrew D. Koffman, Jon R. Pratt, John R. Lawall
This paper reports progress on the NIST effort to develop a new calculable capacitor, focusing on improvement of the guard electrode motion control as well as

Eddy Current Rail Inspection Using AC Bridge Techniques

Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang
AC bridge techniques commonly used for precision impedance measurements have been adopted to develop an eddy current sensor for rail defect detection. By using

Advanced Capacitance Metrology for Nanoelectronic Device Characterization

Curt A. Richter, Joseph J. Kopanski, Yicheng Wang, Muhammad Y. Afridi, Xiaoxiao Zhu, D. E. Ioannou, Qiliang Li, Chong Jiang
We designed and fabricated a test chip (consisting of an array of metal-oxide-semiconductor (MOS) capacitors and metal-insulator-metal (MIM) capacitors ranging
Created June 4, 2019