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https://www.nist.gov/people/wei-ren
Wei Ren (Fed)
Ms. Ren is a guest researcher in the Dimensional Metrology Group in the Sensor Science Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST).
Prashanth Jaganmohan, Bala Muralikrishnan, Vincent Lee, Wei Ren, Octavio Icasio Hernandez, Ed Morse
In this paper, we explore the sensitivity of the length tests described in the VDI/VDE 2634-1 guideline to systematic errors in a passive stereo vision system
Jeffrey A. Jargon, Dylan F. Williams, Angela C. Stelson, Christian J. Long, Aaron M. Hagerstrom, Paul D. Hale, John R. Stoup, Eric S. Stanfield, Wei Ren
In this report, we document the models and dimensional traceability of our WR15 rectangular waveguide standards for performing multiline thru-reflect-line
Balasubramanian Muralikrishnan, Katharine M. Shilling, Steven D. Phillips, Wei Ren, Vincent Lee, Felix H. Kim
X-ray computed tomography (XCT), long used in medical imaging and defect inspection, is now increasingly used for dimensional measurements of geometrical
Balasubramanian Muralikrishnan, Katharine M. Shilling, Steven D. Phillips, Wei Ren, Vincent Lee, Felix H. Kim
The development of standards for evaluating the performance of X-ray computed tomography instruments is ongoing within ASME and ISO working committees. A key
Balasubramanian Muralikrishnan, Katharine M. Shilling, Steven D. Phillips, Wei Ren, Vincent D. Lee, Felix H. Kim, Gabriel Alberts, Valentina Aloisi
X-ray computed tomography (XCT) is uniquely suitable for non-destructive dimensional metrology of delicate or internal features generated from the additive