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W.Bertrand (Randy) Doriese (Fed)

Randy Doriese is a research physicist in the Quantum Sensors Group at NIST in Boulder, CO. He joined NIST as a National Research Council Postdoctoral Fellow in 2002. His areas of research include the development of superconducting readout circuitry for low-temperature sensors and the application of the arrays of these sensors to X-ray spectroscopy. He has received NIST Gold and Bronze Medal Awards for his research.

Research Interests

  • SQUID readout of Transition-Edge Sensors
  • Cryogenic Design and Engineering
  • X-ray Spectroscopy

Publications

Characterization of Silicon-Membrane TES Microcalorimeters for Large-Format X-ray Spectrometers with Integrated Microwave SQUID Readout

Author(s)
Avirup Roy, Robinjeet Singh, Joel Weber, William Doriese, Johnathon Gard, Mark Keller, John Mates, Kelsey Morgan, Galen O'Neil, Nathan Ortiz, Daniel Swetz, Daniel Schmidt, Joel Ullom, Evan Jahrman, Thomas Allison, Sasawat Jamnuch, John Vinson, Charles Titus, Cherno Jaye, Daniel Fischer
We present the electrothermal characterization of transition-edge sensor (TES) detectors suspended on Si membranes fabricated using a silicon-on-insulator wafer...

Speciation of cesium in a radiocesium-bearing microparticle emitted from Unit 1 during the Fukushima nuclear accident by XANES spectroscopy using transition edge sensor

Author(s)
Yoshio Takahashi, Shinya Yamada, Hikaru Miura, Yuichi Kurihara, Oki Sekizawa, Kiyofumi Nitta, Tadashi Hashimoto, Masato Tanaka, Minako Kurisu, Shinji Okada, Takaaki Itai, Hiroki Suga, Teruhiko Kashiwabara, Kohei Sakata, Hideyuki Tatsuno, Ryota Hayakawa, Hirotaka Suda, Takaya Ohashi, Yoshitaka Ishisaki, Takuma Okumura, Yuto Ichinohe, Tasuku Hayashi, Yuki Imai, Hirofumi Noda, Toru Tamagawa, Tadaaki Isobe, Toshiyuki Azuma, William Doriese, Joel Ullom, Daniel Swetz, Malcolm Durkin, Galen O'Neil, Satoshi Kohjiro, Shogo Higaki, Daisuke Tsumune, Masayoshi Yamamoto, Tomoya Uruga
The chemical state of radiocesium (RCs) was determined using X-ray absorption near-edge structure (XANES) in fluorescence mode and microbeam X-ray fluorescence...

Patents (2018-Present)

X-Ray Spectrometer

X-Ray Spectrometer

NIST Inventors
Kevin L. Silverman , Carl D. Reintsema , Luis Miaja Avila , Daniel Swetz , W.Bertrand (Randy) Doriese , Dan Schmidt , Bradley Alpert , Joseph Fowler , Joel Ullom and Ralph Jimenez
This invention includes: an x-ray plasma source that produces primary x-rays; an x-ray optic that transmits and focuses the primary x-ray onto a sample jet from which fluorescence x-ray are emitted; and a microcalorimeter array detector that measures the energy of the incoming fluorescence x-rays
Created October 9, 2019, Updated December 15, 2023
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