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W.Bertrand (Randy) Doriese (Fed)

Randy Doriese is a research physicist in the Quantum Sensors Group at NIST in Boulder, CO. He joined NIST as a National Research Council Postdoctoral Fellow in 2002. His areas of research include the development of superconducting readout circuitry for low-temperature sensors and the application of the arrays of these sensors to X-ray spectroscopy. He has received NIST Gold and Bronze Medal Awards for his research.

Research Interests

  • SQUID readout of Transition-Edge Sensors
  • Cryogenic Design and Engineering
  • X-ray Spectroscopy

Publications

Application of hard x-ray and gamma-ray TES microcalorimeters at an accelerator facility

Author(s)
Takeshi Saito, Shinji Okada, Yuichi Toyoma, Toshiyuki Azuma, Gonçalo Baptista, Daniel Becker, Douglas Bennett, William Doriese, Joseph Fowler, Johnathon Gard, Tadashi Hashimoto, Ryota Hayakawa, Tasuku HAYASHI, Yuto Ichinohe, Josef Imrek, Paul Indelicato, Tadaaki Isobe, Sohtaro Kanda, Naritoshi Kawamura, John Mates, Yasuhiro Miyake, Kelsey Morgan, Hirofumi Noda, Galen O'Neil, Takuma Okumura, Nancy Paul, Daniel Schmidt, Kouichiro Shimomura, Patrick Strasser, Daniel Swetz, Tadayuki Takahashi, Motonobu Tampo, Joel Ullom, Izumi Umegaki, Joel Weber, Shinya Yamada, Daikang Yan
The x-ray spectroscopy of the muonic atom has attracted atomic, nuclear, and particle physicists since its discovery. The properties of a muonic atom, such as

EMI susceptibility of a differential time-division SQUID multiplexing circuit for TES readout

Author(s)
Malcolm Durkin, Douglas Bennett, William Doriese, Johnathon Gard, Johannes Hubmayr, Richard Lew, Erin Maloney, Carl Reintsema, Robinjeet Singh, Daniel Schmidt, Joel Ullom, Leila Vale, Michael Vissers
Time Division multiplexing (TDM) using superconducting quantum interference devices (SQUIDs) is being developed to read out Transition-edge sensor arrays for

Few-electron highly charged muonic Ar atoms verified by electronic K xrays

Author(s)
Takuma Okumura, Toshiyuki Azuma, Douglas Bennett, W. Bertrand (Randy) Doriese, Malcolm Durkin, Joseph Fowler, Johnathon Gard, Tadashi Hashimoto, Ryota Hayakawa, Yuto Ichinohe, Paul Indelicato, Tadaaki Isobe, Sohtaro Kanda, Daiji Kato, Miho Katsuragawa, Naritoshi Kawamura, Yasushi Kino, Nao Kominato, Yasuhiro Miyake, Kelsey Morgan, Hirofumi Noda, Galen O'Neil, Shinji Okada, Kenichi Okutsu, Nancy Paul, Carl D. Reintsema, Toshiki Sato, Dan Schmidt, Kouichiro Shimomura, Patrick Strasser, Daniel Swetz, Tadayuki Takahashi, Shinichiro Takeda, Soshi Takeshita, Motonobu Tampo, Hideyuki Tatsuno, Tong Xiao-Min, Joel Ullom, Shin Watanabe, Shinya Yamada, Takuma Yamashita
Electronic K x rays emitted by muonic Ar atoms in the gas phase were observed using a superconducting transition-edge-sensor microcalorimeter. The high

Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer

Author(s)
Nathan Nakamura, Paul Szypryt, Amber Dagel, Bradley Alpert, Douglas Bennett, W.Bertrand (Randy) Doriese, Malcolm Durkin, Joseph Fowler, Dylan Fox, Johnathon Gard, Ryan Goodner, James Zachariah Harris, Gene C. Hilton, Edward Jimenez, Burke Kernen, Kurt Larson, Zachary H. Levine, Daniel McArthur, Kelsey Morgan, Galen O'Neil, Christine Pappas, Carl D. Reintsema, Dan Schmidt, Peter Schulz, Daniel Swetz, Kyle Thompson, Joel Ullom, Leila R. Vale, Courtenay Vaughan, Christopher Walker, Joel Weber, Jason Wheeler
X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but it is difficult to implement due to the competing
View more Publications

Patents (2018-Present)

X-Ray Spectrometer

X-Ray Spectrometer

NIST Inventors
Kevin L. Silverman , Carl D. Reintsema , Galen O'Neil , Luis Miaja Avila , Daniel Swetz , W.Bertrand (Randy) Doriese , Dan Schmidt , Bradley Alpert , Joseph Fowler , Joel Ullom and Ralph Jimenez
This invention includes: an x-ray plasma source that produces primary x-rays; an x-ray optic that transmits and focuses the primary x-ray onto a sample jet from which fluorescence x-ray are emitted; and a microcalorimeter array detector that measures the energy of the incoming fluorescence x-rays
View All Patents
Created October 9, 2019, Updated December 15, 2023