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Theodore V. Vorburger (Assoc)

Dr. Vorburger is a guest researcher in the Surface and Interface Metrology Group in the Sensor Science Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST) and a former group leader there. During his tenure as an employee from 1972 to 2009, he was responsible for surface roughness and step height calibrations, which underpin the U.S. measurement system for surface finish. He led the development of a light scattering system for measuring surface roughness, and he collaborated in the development of the world’s first sinusoidal-roughness Standard Reference Materials. Ted was also co-leader of a project to develop standard bullets and standard cartridge cases for forensic laboratories and of a team to assess the feasibility of a National Ballistics Imaging Database of new guns under a National Academies Project. He is a member and former Chair of the American Society of Mechanical Engineers Standards Committee B46 on the Classification and Designation of Surface Qualities, a Subject Matter Expert for the equivalent Working Group under the International Organization for Standardization (ISO), and a member of the Firearms and Toolmarks Subcommittee in the Organization of Scientific Area Committees. He currently leads a collaborative project under the NIST Special Programs Office to review the scientific foundations for firearm examination. Ted is the author or co-author of more than 200 publications in surface metrology and related fields, including approximately 38 in the field of firearm examination.


Chief Editor, Journal of Research of NIST, 2001- 2007

NIST Edward Bennett Rosa Award (Group), 1996

NIST Bronze Medal (Group), 1994

NIST Slichter Award (Group), 1993

Department of Commerce Silver Medal, 1992  

Project Specialist, Chinese University Development Project, Chongqing Univ.,China, 1986


Emerging Technology in Comparisons

Theodore V. Vorburger, Jun-Feng Song, Nicholas D. Petraco, Ryan Lilien
This chapter is designed to introduce the reader to emerging technologies relating to 3D surface topography measurement and comparative analysis. While the
Created October 1, 2019, Updated December 8, 2022