Steve Blankenship is an Instrumentation Specialist in the Nanoscale Processes and Measurements Group of the Nanoscale Device Characterization Division. He received a B.S. in Physics from the University of Mary Washington, and a M.S. degree in Physics from Virginia Commonwealth University for research in surface science. Steve is an expert on computer-aided design (CAD) of experimental apparatus and instruments. His surface science background coupled with his engineering expertise has led to the design and construction of state-of-the-art experimental apparatus and instruments. Most notably are his contributions to the design and construction of scanning tunneling microscopy systems that operate in ultra-high vacuum, at cryogenic temperatures, and in high magnetic fields. While Steve's main expertise is in designing and building surface science instrumentation and molecular beam epitaxy systems, his knowledge and abilities allow him to assist Division staff with all phases of diverse experimental design, construction, system maintenance, and troubleshooting of complex problems. His contributions to NIST research program are widely acknowledged in publications. In 2013, Steve was honored by the American Vacuum Society (AVS) where he received the George T. Hanyo Award for his contributions to the scanning tunneling microscopy user facility.