Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Steven R. Blankenship (Fed)

Steve Blankenship is an Instrumentation Specialist in the Nanoscale Processes and Measurements Group of the Nanoscale Device Characterization Division. He received a B.S. in Physics from the University of Mary Washington, and a M.S. degree in Physics from Virginia Commonwealth University for research in surface science. Steve is an expert on computer-aided design (CAD) of experimental apparatus and instruments. His surface science background coupled with his engineering expertise has led to the design and construction of state-of-the-art experimental apparatus and instruments. Most notably are his contributions to the design and construction of scanning tunneling microscopy systems that operate in ultra-high vacuum, at cryogenic temperatures, and in high magnetic fields. While Steve's main expertise is in designing and building surface science instrumentation and molecular beam epitaxy systems, his knowledge and abilities allow him to assist Division staff with all phases of diverse experimental design, construction, system maintenance, and troubleshooting of complex problems. His contributions to NIST research program are widely acknowledged in publications. In 2013, Steve was honored by the American Vacuum Society (AVS) where he received the George T. Hanyo Award for his contributions to the scanning tunneling microscopy user facility.

Selected Publications

  • Real-Space Imaging of Structural Transitions in the Vortex Lattice of V3Si, C.E. Sosolik, J. A. Stroscio, M. D. Stiles, E. W. Hudson, S. R. Blankenship, A. P. Fein, R. J. Celotta, Physical Review Letters 68(14), 140503-1 (2003).
  • A Facility for Nanoscience Research: An Overview, J. A. Stroscio, E. W. Hudson, S. R. Blankenship, R. J. Celotta, and A. P. Fein, in Proceedings of the SPIE, Nanostructure Science, Metrology, and Technology, 4608, ed. by M.C. Peckerar and M.T. Postek, Gaithersburg, MD, (2002) p. 112.
  • A Low Temperature STM System for the Study of Quantum and Spin Electronic Systems, J. A. Stroscio, R. J. Celotta, S. R. Blankenship, E. W. Hudson, and A. P. Fein, in Proceedings of the 4th International Workshop on Quantum Functional Devices, November 15, 2000.
  • Electronic Structure and Crystalline Coherence in Fe/Si Multilayers, J. A. Carlisle, S. R. Blankenship, R. N. Smith, A. Chaiken, R. P. Michel, T. Van Buuren, L. J. Terminello, J. J. Jia, D. L. Callcott, and D. L. Ederer, Journal of Cluster Science 10(4), 591-599 (1999).
  • Reconstructions of Ag on High-Index Silicon Surfaces, S. R. Blankenship, H. H. Song, A. A. Baski, and J. A. Carlisle, Journal of Vacuum Science & Technology A 17(4), 1615-1620 (1999).



Visualizing the merger of tunably coupled graphene quantum dots

Daniel Walkup, Fereshte Ghahari, Steven R. Blankenship, Kenji Watanabe, Takashi Taniguchi, Nikolai Zhitenev, Joseph A. Stroscio
Coupled quantum dots have been realized in a wide variety of physical systems and have attracted interest for many different applications. Here, we examine

A quantum ruler for orbital magnetism in moiré quantum matter

Marlou Slot, Yulia Maximenko, Paul M. Haney, Sungmin Kim, Daniel Walkup, Evgheni Strelcov, En-Min Shih, Dilek Yildiz, Steven R. Blankenship, Kenji Watanabe, Takashi Taniguchi, Yafis Barlas, Nikolai Zhitenev, Fereshte Ghahari Kermani, Joseph A. Stroscio
Topological properties that underlie the rich emergent phases of moiré quantum matter (MQM) result from the eigenstate geometry of the moiré Hamiltonian. The

Soft X-Ray Fluorescence Studies of Solids

J A. Carlisle, Steven R. Blankenship, R N. Smith, Eric L. Shirley, L J. Terminello, J J. Jia, T A. Callcott, D L. Ederer
Resonant inelastic x-ray scattering (RIXS) has been observed in many systems above and below their core threshold. Below threshold, inelastic-loss features are

Edge channels of broken-symmetry quantum Hall states in graphene visualized by atomic force microscopy

Joseph A. Stroscio, Sungmin Kim, Johannes Schwenk, Daniel T. Walkup, Yihang Zeng, Fereshte Ghahari, Son T. Le, Marlou R. Slot, Julian Berwanger, Steven R. Blankenship, Kenji Watanabe, Takashi Taniguchi, Franz Giessibl, Nikolai Zhitenev, Cory Dean
The quantum Hall (QH) effect, a topologically non-trivial quantum phase, expanded and brought into focus the concept of topological order in physics. The

Achieving µeV tunneling resolution in an in-operando scanning tunneling microscopy, atomic force microscopy, and magnetotransport system for quantum materials research

Johannes Schwenk, Sungmin Kim, Julian Berwanger, Fereshte Ghahari Kermani, Daniel T. Walkup, Marlou R. Slot, Son T. Le, W. G. Cullen, Steven R. Blankenship, Sasa Vranjkovic, Hans Hug, Young Kuk, Franz Giessibl, Joseph A. Stroscio
Research in new quantum materials require multi-mode measurements spanning length scales, correlations of atomic scale variables with macroscopic function, and
Created September 24, 2019, Updated December 8, 2022