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Paul Szypryt (Assoc)

Publications

Design of a 3000 pixel transition-edge sensor x-ray spectrometer for microcircuit tomography

Author(s)
Paul Szypryt, Douglas Bennett, William J. Boone, Amber L. Dagel, G Dalton, William Doriese, Malcolm Durkin, Joseph Fowler, Edward Garboczi, Jonathon D. Gard, Gene Hilton, Jozsef Imrek, E S. Jimenez, Vincent Y. Kotsubo, K Larson, Zachary H. Levine, John Mates, D McArthur, Kelsey Morgan, Nathan J. Nakamura, Galen O'Neil, Nathan Ortiz, Christine G. Pappas, Carl Reintsema, Dan Schmidt, Daniel Swetz, K R. Thompson, Joel Ullom, C Walker, Joel C. Weber, Abigail Wessels, J W. Wheeler
Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex

A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap

Author(s)
Paul Szypryt, Galen C. O'Neil, Endre Takacs, Joseph N. Tan, Sean W. Buechele, Aung Naing, Douglas A. Bennett, William B. Doriese, Malcolm S. Durkin, Joseph W. Fowler, Johnathon D. Gard, Gene C. Hilton, Kelsey M. Morgan, Carl D. Reintsema, Daniel R. Schmidt, Daniel S. Swetz, Joel N. Ullom, Yuri Ralchenko
We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at

On Low-Energy Tail Distortions in the Detector Response Function of X-Ray Microcalorimeter Spectrometers

Author(s)
Galen C. O'Neil, Paul Szypryt, Endre Takacs, Joseph N. Tan, Sean W. Buechele, Aung Naing, Young I. Joe, Daniel S. Swetz, Daniel R. Schmidt, William B. Doriese, Johnathon D. Gard, Carl D. Reintsema, Joel N. Ullom, John S. Villarrubia, Yuri Ralchenko
We use narrow spectral lines from the X-ray spectra of various highly charged ions to measure low-energy tail-like deviations from a Gaussian response function

A TES X-ray Spectrometer for NSENSE

Author(s)
Christine G. Pappas, Malcolm S. Durkin, Joseph W. Fowler, Kelsey M. Morgan, Joel N. Ullom, William B. Doriese, Gene C. Hilton, Galen C. O'Neil, Daniel R. Schmidt, Paul Szypryt, Daniel S. Swetz
The Non-destructive Statistical Estimation of Nanoscale Structures and Electronics NSENSE instrument for IARPAs Rapid Analysis of Various Emerging

Demonstration of Athena X-IFU Compatible 40-Row Time-Division-Multiplexed Readout

Author(s)
Malcolm S. Durkin, Joseph S. Adams, Simon R. Bandler, James A. Chervenak, Saptarshi Chaudhuri, Carl S. Dawson, Edward V. Denison, William B. Doriese, Shannon M. Duff, F. M. Finkbeiner, C. T. FitzGerald, Joseph W. Fowler, Johnathon D. Gard, Gene C. Hilton, Kent D. Irwin, Young I. Joe, R. L. Kelley, Caroline A. Kilbourne, A. R. Miniussi, Kelsey M. Morgan, Galen C. O'Neil, Christine G. Pappas, F. S. Porter, Carl D. Reintsema, David A. Rudman, Kazuhiro Sakai, Stephen J. Smith, Robert W. Stevens, Daniel S. Swetz, Paul Szypryt, Joel N. Ullom, Leila R. Vale, N. Wakeham, Joel C. Weber, B. A. Young
Time-division multiplexing (TDM) is the backup readout technology for the X-ray Integral Field Unit (X-IFU), a 3168-pixel X-ray transition-edge sensor (TES)
Created October 16, 2019, Updated June 30, 2022