Paul Kienzle

Publications

Nanolayer Analysis by Neutron Reflectometry

July 18, 2017

Author(s):

Joseph A. Dura, Eric Daniel Rus, Paul Kienzle, Brian B. Maranville

Neutron reflectometry offers unique benefits for nanolayer research in green chemistry by providing accurate depth profiles of thin films and interfaces with...

Bayesian Method for the Analysis of Diffraction Patterns using BLAND

December 01, 2016

Author(s):

Joseph E. Lesniewski, Steven M.T. Disseler, Dylan J. Quintanta, Paul Kienzle, William D. Ratcliff

Rietveld refinement of x-ray and neutron diffraction patterns is routinely used to solve crystal and magnetic structures of organic and inorganic materials...

Measurement and Modeling of Polarized Specular Neutron Reflectivity in Large Magnetic Fields

August 01, 2016

Author(s):

Brian B. Maranville, Brian J Kirby, Alexander J Grutter, Paul Kienzle, Charles F. Majkrzak, Yaohua Liu, Cindi L. Dennis

The presence of a large applied magnetic field removes the degeneracy of the vacuum energy states for spin-up and spin-down neutrons. For polarized neutron...

Spatial Evolution of the Ferromagnetic Phase Transition in an Exchange Graded Film

January 29, 2016

Author(s):

Brian J. Kirby, H. F. Belliveau, D. D. Belyea, Paul A. Kienzle, Alexander J. Grutter, P. Riego, A. Berger, Casey W. Miller

A combination of experiments and numerical modeling was used to study the spacial evolution of the ferromagnetic phase transition in a thin film engineered to...

Phase Segregation of Sulfonate Groups in Nafion Interface Lamellae, Quantified via Neutron Reflectometry Fitting Techniques for Multi-Layered Structures

August 21, 2014

Author(s):

Steven C. DeCaluwe, Paul A. Kienzle, Pavan Bhargava, Andrew M. Baker, Joseph A. Dura

Neutron reflectometry analysis methods are developed and used to determine the composition depth profile in cases where the structure is no known a priori...