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Michael R. Winchester (Fed)

Michael's research activities at NIST have focused on several areas, including glow discharge optical emission spectrometry (GD-OES) for bulk elemental and depth profile analyses of solid materials, Fourier Transform atomic emission spectroscopy (FT-AES) for fundamental studies of analytical plasmas and accurate determinations of spectral wavelengths, and the use of differential mobility analyzers (DMAs), aerosol electrometers, and other aerosol metrology equipment for making accurate, traceable measurements of aerosol concentrations and particle sizes. Michael's current research activities are focused on the development of methodologies for accurate, traceable physical and chemical characterizations of nanoparticles that are engineered for a wide variety of applications (e.g., functionalized gold nanoparticles used for modern cancer therapies). He also has a strong research program concerned with developing unique approaches to the use of inductively-coupled plasma optical emission spectrometry (ICP-OES) and inductively-coupled plasma mass spectrometry (ICP-MS) to enable very accurate chemical analyses with very strong traceability links to the International System of Units (SI).

Michael has contributed to the development and certification of a range of NIST Standard Reference Materials (SRMs) over the years. He is now Technical Project Leader for more than 75 SRMs, including the well-known SRM 3100 Series of spectrometric solution standards. Currently, Michael is the leader of the Spectrochemical Methods team within the Inorganic Chemical Metrology Group.  He has authored or co-authored more than 60 presentations at major scientific conferences and more than 25 peer-reviewed publications, as well as chapters for four edited volumes. He has been active on committees of the ASTM International and the International Organization for Standardisation (ISO) for approximately the past 15 years.

Awards:

  • Spectrochimica Acta Atomic Spectroscopy Award, 1993
  • United States Department of Commerce Silver Medal Award, 2008

Membership and Professional Activities:

  • American Chemical Society, Member – 1988 to 1992
  • Society for Applied Spectroscopy, Member – 1988 to 1997
    - Alternate Delegate, Baltimore/Washington Section – 1993 to 1994
    - Delegate, Baltimore/Washington Section – 1994 to 1995
  • ASTM International E42 Surface Chemical Analysis
    - Expert – 1994 to present
  • ISO TC201 Surface Chemical Analysis           
  • ISO TC201/SC1 Terminology
    - United States Delegate – 1998 to present
  • ISO TC201/SC8 Glow Discharge Spectrometry
    - United States Delegate – 1994 to present
    - Chair, Advisory Group on Reference Materials – 1995 to 1999         
  • ISO/TC201/SC8/WG1 Characterization of Coatings Working Group
    - United States Expert – 1998 to present

Publications

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret Kline, Katrice Lippa, Enrico Lucon, John L. Molloy, Michael Nelson, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Lane C. Sander, John E. Schiel, Katherine E. Sharpless, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged

Decision Tree for Key Comparisons

Author(s)
Antonio Possolo, Amanda Koepke, David Newton, Michael R. Winchester
This contribution describes a Decision Tree intended to guide the selection of statistical models and data reduction procedures in key comparisons (KCs). The

CCQM-K143 Comparison of Copper Calibration Solutions Prepared by NMIs/DIs

Author(s)
John L. Molloy, Michael R. Winchester, Therese A. Butler, Olaf Rienitz, Volker Goerlitz, Anita Roethke, Volker Goerlitz, Rodrigo Caciano de Sena, Lu Yang, Kenny Nadeau, Patricia R. Arancibia, Wu Bing, Zhou Tao, James Snell, Jochen Vogl, Maren Koenig, R. K. Kotnala, S. Swarupa Tripathy, Christine Elishian, Rosi Ketrin, Toshihiro Suzuki, Tom Oduor Okumu, Yong-Hyeon Yim, Judith Velina Lara Manzano, Mirella Buzoianu, Alena Sobina, Veniamin Zyskin, Egor Sobina, Pavel Migal, Mare Linsky, Suleyman Z. Can, Betul Ari, Heidi Goenaga Infante
CCQM-K143 is a key comparison that assesses participants' ability to prepare single element calibration solutions. Preparing calibration solutions properly is

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret C. Kline, Katrice Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Katherine E. Sharpless, John R. Sieber, Blaza Toman, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged
Created October 9, 2019, Updated December 8, 2022