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https://www.nist.gov/people/mark-alexander-henn
Mark-Alexander Henn (Assoc)
Dr. Henn is a guest researcher in the Surface & Nanostructure Metrology Group in the Engineering Physics Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST).
Klaus Natorf Quelhas, Mark-Alexander Henn, Ricardo Cordeiro de Farias, Weston L. Tew, Solomon I. Woods
Magnetic Particle Imaging (MPI) is a novel technique developed for remotely detecting magnetic nanoparticle (MNP) tracers, with great potential for biomedical
Klaus Natorf Quelhas, Mark-Alexander Henn, Ricardo Farias, Weston L. Tew, Solomon I. Woods
Image reconstruction is a fundamental step in Magnetic Particle Imaging (MPI). Since it was developed, several methods have been studied to perform more
Thinh Bui, Mark-Alexander Henn, Weston L. Tew, Megan Catterton, Solomon I. Woods
Advances in instrumentation and tracer materials are still required to enable sensitive and accurate 3D temperature monitoring by magnetic particle imaging. We
Background: Patterning defect metrology requires data interpretation with classification, each well-suited to machine learning (ML). Defect classification