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https://www.nist.gov/people/mark-alexander-henn
Mark-Alexander Henn (Assoc)
Dr. Henn is a guest researcher in the Surface & Nanostructure Metrology Group in the Engineering Physics Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST).
Thinh Bui, Mark-Alexander Henn, Weston L. Tew, Megan Catterton, Solomon I. Woods
Advances in instrumentation and tracer materials are still required to enable sensitive and accurate 3D temperature monitoring by magnetic particle imaging. We
Background: Patterning defect metrology requires data interpretation with classification, each well-suited to machine learning (ML). Defect classification
Klaus Natorf Quelhas, Mark-Alexander Henn, Ricardo Cordeiro de Farias, Weston L. Tew, Solomon I. Woods
This work shows that it is possible to obtain faster MPI image reconstructions by implementing the algorithms in parallel in Graphics Processing Units (GPUs)
In this work we investigate how the MPI resolution changes as a function of signal harmonics. Based on a simulation study that models a lock-in measurement of